Characterization of ultrananocrystalline diamond thin films using low energy scanning electron microscopy
| Authors | |
|---|---|
| Year of publication | 2011 |
| Type | Conference abstract |
| MU Faculty or unit | |
| Citation | |
| Description | This paper deals with the low energy scanning electron microscopy characterization of ultrananocrystalline diamond films. These films were prepared by plasma enhanced chemical vapor deposition (PECVD) using dual frequency discharge. |
| Related projects: |