Spektrální elipsometrická charakterizace tenkých epitaxních vrstev Si_(1-x)Ge_x

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Title in English	Spectroellipsometric characterization of thin epitaxial Si_(1-x)Ge_x lazers
Authors	LÍBEZNÝ Milan CAYMAX M. BRABLEC Antonín KUBĚNA Josef HOLÝ Václav
Year of publication	1994
Type	Chapter of a book
MU Faculty or unit	Faculty of Science
Citation
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