Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods

• Authors: DARHUBER A.A.; HOLÝ Václav; SCHITTENHELM P.; STANGL J.; KEGEL I.; KOVATS Z.; METZGER T.H.; BAUER G.; ABSTREITER G.; GRUEBEL G.
• Year of publication: 1998
• Type: Article in Periodical
• Magazine / Source: Physica E 2
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism
• Keywords: multilayers by x-ray

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