Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices

Warning

This publication doesn't include Faculty of Arts. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	HOLÝ Václav MEDUŇA Mojmír ROCH Tomáš BAUER Guenther
Year of publication	2002
Type	Article in Periodical
Magazine / Source	Semicond. Sci. Technol.
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
Description	Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
Related projects:	Self-organization processes on the interfaces during epitaxial growth of semiconductor superlattices Physical properties of new materials and layered structures